Investigations of radiation generation under the grazing interaction between a betatron’s internal beam and periodic layered structures / M. M. Rychkov [et al.]
Уровень набора: Journal of Surface Investigation. X-ray, Synchrotron and Neutron TechniquesЯзык: английский.Резюме или реферат: The first results of an experimental investigation into the generation of X-ray bremsstrahlung under grazing interaction between the internal 18-MeV electron beam of a B-18 betatron and a silicon crystal 50 ?m thick and 4 mm long along the electron beam are presented. The experiments refer to the research of X-ray formation in the case of the grazing interaction of electrons with layered structures created on thin Si substrate surfaces. In the case of emission from layered structures, radiation emitted from the substrates is an intense background varying greatly with substrate orientation. This must be taken into account when the orientation dependences of the characteristics, e.g., radiation formed in X-ray mirrors and waveguides, are measured..Примечания о наличии в документе библиографии/указателя: [References: 8 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | бетатроны | релятивистские электроны | поверхностные структуры | рентгеновское излучение Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
[References: 8 tit.]
The first results of an experimental investigation into the generation of X-ray bremsstrahlung under grazing interaction between the internal 18-MeV electron beam of a B-18 betatron and a silicon crystal 50 ?m thick and 4 mm long along the electron beam are presented. The experiments refer to the research of X-ray formation in the case of the grazing interaction of electrons with layered structures created on thin Si substrate surfaces. In the case of emission from layered structures, radiation emitted from the substrates is an intense background varying greatly with substrate orientation. This must be taken into account when the orientation dependences of the characteristics, e.g., radiation formed in X-ray mirrors and waveguides, are measured.
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