On the self-testing (m,n)-code checker design / N. Butorina, Yu. B. Burkatovskaya, E. Pakhomova
Уровень набора: (RuTPU)RU\TPU\network\2008, IOP Conference Series: Materials Science and EngineeringЯзык: английский.Резюме или реферат: We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker..Примечания о наличии в документе библиографии/указателя: [References: 9 tit.].Тематика: электронный ресурс | труды учёных ТПУ | дизайн | самотестирование | программы Ресурсы он-лайн:Щелкните здесь для доступа в онлайн | Щелкните здесь для доступа в онлайнНет реальных экземпляров для этой записи
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[References: 9 tit.]
We propose an approach to a self-testing (m, n)-code checker design, based on subdividing the set of all code words into special subsets called segments. The checker circuit is constructed by using one- and two-output configurable logic blocks (CLB). Previously, in each output of a CLB, a function representing exactly one segment was implemented. In the proposed approach, at each CLBs output, it is possible to implement functions that represent several segments and to provide the self-testing property. It allows reducing the number of CLBs and simplifying the circuit of the checker.
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