APA

Fyodorov N., Kryshkin V., Stibunov V. N. & Usov Y. P.A method of coincidence and anti-coincidence circuit characteristics measurements. : .

Chicago

Fyodorov N, Kryshkin V, Stibunov V N and Usov Y P.A method of coincidence and anti-coincidence circuit characteristics measurements. : .

Harvard

Fyodorov N., Kryshkin V., Stibunov V. N. and Usov Y. P.A method of coincidence and anti-coincidence circuit characteristics measurements. : .

MLA

Fyodorov N, Kryshkin V, Stibunov V N and Usov Y P.: . .