APA

Moskovchenko A. I., Svantner M., Vavilov V. P. & Chulkov A. O.Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography. : .

Chicago

Moskovchenko A I, Svantner M, Vavilov V P and Chulkov A O.Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography. : .

Harvard

Moskovchenko A. I., Svantner M., Vavilov V. P. and Chulkov A. O.Characterizing Depth of Defects with Low Size/Depth Aspect Ratio and Low Thermal Reflection by Using Pulsed IR Thermography. : .

MLA

Moskovchenko A I, Svantner M, Vavilov V P and Chulkov A O.: . .