APA

Vlasenko S., Benediktovitch A. I., Ulyanenkov A. P., Uglov V. V., Abadias G., O'Connell J. H. & Janse Van Vuuren Arno.Microstructure Characterization of Multilayer Thin Coatings ZrN/Si3N4 by X-Ray Diffraction Using Noncoplanar Measurement Geometry. : .

Chicago

Vlasenko S, Benediktovitch A I, Ulyanenkov A P, Uglov V V, Abadias G, O'Connell J H and Janse Van Vuuren Arno.Microstructure Characterization of Multilayer Thin Coatings ZrN/Si3N4 by X-Ray Diffraction Using Noncoplanar Measurement Geometry. : .

Harvard

Vlasenko S., Benediktovitch A. I., Ulyanenkov A. P., Uglov V. V., Abadias G., O'Connell J. H. and Janse Van Vuuren Arno.Microstructure Characterization of Multilayer Thin Coatings ZrN/Si3N4 by X-Ray Diffraction Using Noncoplanar Measurement Geometry. : .

MLA

Vlasenko S, Benediktovitch A I, Ulyanenkov A P, Uglov V V, Abadias G, O'Connell J H and Janse Van Vuuren Arno.: . .