APA

Moskovchenko A. I., Svantner M., Vavilov V. P. & Chulkov A. O.Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. : .

Chicago

Moskovchenko A I, Svantner M, Vavilov V P and Chulkov A O.Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. : .

Harvard

Moskovchenko A. I., Svantner M., Vavilov V. P. and Chulkov A. O.Analyzing probability of detection as a function of defect size and depth in pulsed IR thermography. : .

MLA

Moskovchenko A I, Svantner M, Vavilov V P and Chulkov A O.: . .