Small-size betatrons for flaw detection / V. L. Chakhlov, M. M. Shtein, V. A. Kas'yanov

Основной Автор-лицо: Chakhlov, V. L., physicist, Honored worker of science and technology of the Russian Federation, Honored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc), 1934-2011, Vladimir LukianovichАльтернативный автор-лицо: Shtein, M. M., Physicist, Head of Laboratory at Tomsk Polytechnic University, Candidate of technical sciences, 1938-, Mikhail Mikhailovich, 070;Kas'yanov, V. A.Язык: английский.Страна: .Резюме или реферат: The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV..Аудитория: .Тематика: труды учёных ТПУ
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The Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV.

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