Structure and properties of nanoproducts of the system P2O5 - SiO2 / T. S. Petrovskaya [et al.]

Уровень набора: Glass and Ceramics = 2008Альтернативный автор-лицо: Petrovskaya, T. S.;Borilo, L. P.;Kozik, V. V.;Vereshchagin, V. I., Russian scientist of chemical engineering, Professor of silicates technology of Tomsk Polytechnic University, 1942-, Vladimir IvanovichЯзык: английский.Страна: .Резюме или реферат: Thin films and dispersed products in the system SiO2 -P2O5 with phosphorus oxide molar content from 0 to 30% have been obtained by the sol-gel method from film-forming solutions based on tetraethoxysilane and phosphoric acid, ethyl alcohol, and water. The variations of the rheological properties in successive states of the solution - sol-gel system are established. The physical - chemical processes in solution with deposition on a substrate and with heat-treatment of the product are investigated. IR spectroscopy and atomic-force microscopy are used to study the structure and physical - chemical properties of the films and disperse products obtained.Примечания о наличии в документе библиографии/указателя: References: p. 414.Аудитория: .Тематика: труды учёных ТПУ
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References: p. 414

Thin films and dispersed products in the system SiO2 -P2O5 with phosphorus oxide molar content from 0 to 30% have been obtained by the sol-gel method from film-forming solutions based on tetraethoxysilane and phosphoric acid, ethyl alcohol, and water. The variations of the rheological properties in successive states of the solution - sol-gel system are established. The physical - chemical processes in solution with deposition on a substrate and with heat-treatment of the product are investigated. IR spectroscopy and atomic-force microscopy are used to study the structure and physical - chemical properties of the films and disperse products obtained

Оригинал на русском языке см.: Стекло и керамика. 2008. N 11. С. 29-33

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