Scaling effects in structural-phase self-organization at the "thin film - substrate" interface / V. E. Panin [et al.]

Уровень набора: Physical MesomechanicsАльтернативный автор-лицо: Panin, V. E., Director of Russian materials science center, Research advisor of Institute of strength physics and materials science of Siberian branch of Russian Academy of Sciences, 1930-, Viktor Evgenyevich;Panin, A. V.;Sergeev, V. P.;Shugurov, A. R.Язык: русский.Резюме или реферат: The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications.Аудитория: .Тематика: труды учёных ТПУ
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The paper demonstrates that at the "thin film - substrate" interface there occurs structural self-organization that reveals two levels of structural-phase scaling. The levels are governed by the formation of cluster and cellular mesostructures. We discuss the nature of structural-phase self-organization, the commonness of the obtained results and their importance for scientific and engineering applications

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