APA

Endo I., Harada M., Kobayashi T., Lee Y. S., Takahashi T., Muto M., Yoshida K., Nitta H., Potylitsyn A. P. & Zabaev V. N. (1993). Measurements of Thickness Dependence of Parametric X-Radiation from Si. : .

Chicago

Endo I, Harada M, Kobayashi T, Lee Y S, Takahashi T, Muto M, Yoshida K, Nitta H, Potylitsyn A P and Zabaev V N. 1993. Measurements of Thickness Dependence of Parametric X-Radiation from Si. : .

Harvard

Endo I., Harada M., Kobayashi T., Lee Y. S., Takahashi T., Muto M., Yoshida K., Nitta H., Potylitsyn A. P. and Zabaev V. N. (1993). Measurements of Thickness Dependence of Parametric X-Radiation from Si. : .

MLA

Endo I, Harada M, Kobayashi T, Lee Y S, Takahashi T, Muto M, Yoshida K, Nitta H, Potylitsyn A P and Zabaev V N. Measurements of Thickness Dependence of Parametric X-Radiation from Si. : . 1993.