Generation of X-rays by 850 MeV electrons in a novel periodic multicrystal structure on a GaAs plate surface / V. V. Kaplin [et al.]
Уровень набора: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Scientific JournalЯзык: английский.Страна: .Резюме или реферат: A novel type of a periodical crystalline target for the generation of coherent X-rays by relativistic electrons is described. The target has been done on the surface of a GaAs crystal plate by means of microlitography. The etched microstructure is a system of about 300 stripes 14 ?m thick, 100 ?m high and the gaps between the stripes are 29 ?m. The measured spectra and orientational dependences of the X-rays emitted at an angle of 19° to the 850 MeV electron beam of the Tomsk synchrotron are discussed. The generated 63 keV radiation consists of parametric X-ray radiation (PXR) and diffracted X-ray transition radiation (DTR). It has been shown that the intensity of the DTR component of the generated X-rays is much more great than that of the PXR.Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
A novel type of a periodical crystalline target for the generation of coherent X-rays by relativistic electrons is described. The target has been done on the surface of a GaAs crystal plate by means of microlitography. The etched microstructure is a system of about 300 stripes 14 ?m thick, 100 ?m high and the gaps between the stripes are 29 ?m. The measured spectra and orientational dependences of the X-rays emitted at an angle of 19° to the 850 MeV electron beam of the Tomsk synchrotron are discussed. The generated 63 keV radiation consists of parametric X-ray radiation (PXR) and diffracted X-ray transition radiation (DTR). It has been shown that the intensity of the DTR component of the generated X-rays is much more great than that of the PXR
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