Control over Hard X-Ray Parameters Using External Temperature Gradient / V. R. Kocharian [et al.]
Уровень набора: (RuTPU)RU\TPU\network\4598, Advanced Materials Research : Radiation and nuclear techniques in material science, Scientific JournalЯзык: английский.Серия: Plasma, Microwave, Ion, Electron and Isotope TechnologiesРезюме или реферат: In order to gain control over hard X-ray (over 30 keV), we have considered the X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient. It was experimentally proved that the intensity of the reflected beam can be increased up to 35 times if the X-ray energies are 30 keV and keV for reflecting atomic planes () depending on the value of the temperature gradient. As the temperature gradient increases, the focus moves closer to the crystal and the focal spot shrinks in the diffraction plane..Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | дифракция | градиенты | температурные градиенты Ресурсы он-лайн:Щелкните здесь для доступа в онлайнНет реальных экземпляров для этой записи
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In order to gain control over hard X-ray (over 30 keV), we have considered the X-ray diffraction in Laue geometry (over 30 keV) from a single crystal of quartz influenced by the temperature gradient. It was experimentally proved that the intensity of the reflected beam can be increased up to 35 times if the X-ray energies are 30 keV and keV for reflecting atomic planes () depending on the value of the temperature gradient. As the temperature gradient increases, the focus moves closer to the crystal and the focal spot shrinks in the diffraction plane.
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