Synthesis of Transparent Conductive Coating In[2]O[3]:Sn Films from Film Forming Solutions / S. A. Kuznetsova, V. V. Kozik, A. G. Malchik
Уровень набора: (RuTPU)RU\TPU\network\5920, Applied Mechanics and Materials, Scientific JournalЯзык: английский.Страна: .Серия: Material Science, Machining Technologies and Equipments in Mechanical EngineeringРезюме или реферат: Materials based on films In[2]O[3]:Sn found commercial use as optical materials because of their high reflectance in infra red radiation and transmittance in visible spectrum. This paper investigates effects of treatment of glass substrates with acid (СН[3]COOH), basic (NaOH) etchants and an etchant having oxidation ability and acidic properties (chromic mixture) on optical properties of films In2O3:Sn proposed for solar cells and LEDs. The resulting films are characterized by high transparency 75-90% in visible spectrum for the values of refractive index 1.82-1.90. Substrate treating effect on thickness, resistance and transparency of the films is described. Morphology and optical properties of the films were studied by three-dimensional non-contact profilometry, spectrophotometry and ellipsometry..Аудитория: .Тематика: труды учёных ТПУ | электронный ресурс | синтез | пленки | прозрачные покрытия | оксидные покрытия Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
Materials based on films In[2]O[3]:Sn found commercial use as optical materials because of their high reflectance in infra red radiation and transmittance in visible spectrum. This paper investigates effects of treatment of glass substrates with acid (СН[3]COOH), basic (NaOH) etchants and an etchant having oxidation ability and acidic properties (chromic mixture) on optical properties of films In2O3:Sn proposed for solar cells and LEDs. The resulting films are characterized by high transparency 75-90% in visible spectrum for the values of refractive index 1.82-1.90. Substrate treating effect on thickness, resistance and transparency of the films is described. Morphology and optical properties of the films were studied by three-dimensional non-contact profilometry, spectrophotometry and ellipsometry.
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