Fabrication of customizable wedged multilayer Laue lenses by adding a stress layer / S. Niese [et al.]

Уровень набора: Thin Solid Films, International Journal on the Science and Technology of Condensed Matter Films = 1967-Альтернативный автор-лицо: Niese, S., Sven;Krüger, P., Peter;Kubec, A., Adam;Laas, R. A., Physicist, Assistant of the Department of Tomsk Polytechnic University, 1991-, Roman Aleksandrovich;Gawlitza, P., Peter;Melzer, K., Kathleen;Braun, S., Stefan;Zschech, E., EhrenfriedКоллективный автор (вторичный): Национальный исследовательский Томский политехнический университет (ТПУ), Физико-технический институт (ФТИ), Кафедра физико-энергетических установок (№ 21) (ФЭУ)Язык: английский.Страна: .Резюме или реферат: Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution..Примечания о наличии в документе библиографии/указателя: [References: p. 324 (7 tit.)].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | X-ray optics | diffractive optics | X-ray microscopy | multilayers | stress layer | sputter deposition | focused ion beam Ресурсы он-лайн:Щелкните здесь для доступа в онлайн
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[References: p. 324 (7 tit.)]

Diffractive optics for hard X-rays feature superior properties in terms of resolution and efficiency, if volume diffraction effects are exploited all-over the aperture. For multilayer Laue lenses, preferably a wedged geometry is required to obtain this effect. We present an approach utilizing an additional stress layer to realize the necessary geometrical modifications where each lens can be customized to a selected photon energy independently of the given multilayer deposition. The quality of the deposition of the stress layer is evaluated using a laboratory X-ray microscope prior to its application at synchrotron radiation facilities with a special approach to measure the relative layer tilt at high spatial resolution.

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