Optical and AFM studies on p-SNS thin films deposited by magnetron sputtering / V. V. An, M. V. Dronova, A. N. Zakharov
Уровень набора: Chalcogenide LettersЯзык: английский.Страна: .Резюме или реферат: Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images..Примечания о наличии в документе библиографии/указателя: [References: p. 487 (13 tit.)].Аудитория: .Тематика: труды учёных ТПУ | электронный ресурс | атомно-силовая микроскопия | магнетронное распыление Ресурсы он-лайн:Щелкните здесь для доступа в онлайнНет реальных экземпляров для этой записи
Title screen
[References: p. 487 (13 tit.)]
Tin sulfide thin films were prepared by DC magnetron sputtering of a nanostructured SnS target in argon. The obtained samples were analyzed using atomic force microscopy (AFM), radio frequency glow discharge optical emission spectroscopy (RF-GD-OES) and UV-vis spectrophotometry. The thickness, roughness and surface porosity were evaluated using module software for AFM data visualization and analysis Gwyddion. A thin film growth mechanism was suggested based on the analysis of the AFM images.
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