Hard X–ray Filter with Controllable Parameters / T. R . Muradyan [et al.]

Уровень набора: Armenian Journal of PhysicsАльтернативный автор-лицо: Muradyan, T. R .;Gogolev, A. S., physicist, associate professor of Tomsk Polytechnic University, 1983-, Aleksey Sergeevich;Aghabekyan, V. N.;Khlopuzyan, S. N.;Movsisyan, A. E., Artur Egisheevich;Kocharian, V. R., physicist, assistant of Tomsk Polytechnic University, candidate of physico-mathematical Sciences, 1976-, Vagan RashidovichЯзык: русский.Страна: Россия.Резюме или реферат: We consider the hard X–ray diffraction from reflecting atomic planes (1011) of X–cut quartz single crystal with different thicknesses in Laue geometry influenced by the temperature gradient. It has been experimentally proved that, depending on the value of the temperature gradient, the intensity of the reflected beam can be increased by orders of magnitude. It is shown that by using the temperature gradient it is possible to separate a beam with high angular and spectral width from the white beam and move it to the direction of reflection..Примечания о наличии в документе библиографии/указателя: [References: p. 169 (5 tit.)].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | кварцевые кристаллы Ресурсы он-лайн:Щелкните здесь для доступа в онлайн
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[References: p. 169 (5 tit.)]

We consider the hard X–ray diffraction from reflecting atomic planes (1011) of X–cut quartz single crystal with different thicknesses in Laue geometry influenced by the temperature gradient. It has been experimentally proved that, depending on the value of the temperature gradient, the intensity of the reflected beam can be increased by orders of magnitude. It is shown that by using the temperature gradient it is possible to separate a beam with high angular and spectral width from the white beam and move it to the direction of reflection.

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