Thermal damage at short electron bunches passage through a thin target / A. A. Babaev, A. S. Gogolev
Уровень набора: (RuTPU)RU\TPU\network\3526, Journal of Physics: Conference SeriesЯзык: английский.Серия: Monochromatic X- and Gamma Beams Produced at Electron AcceleratorsРезюме или реферат: The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature..Примечания о наличии в документе библиографии/указателя: [References: 8 tit.].Тематика: электронный ресурс | труды учёных ТПУ | тепловые повреждения | электронные сгустки | мишени | электронные лучи Ресурсы он-лайн:Щелкните здесь для доступа в онлайн | Щелкните здесь для доступа в онлайнTitle screen
[References: 8 tit.]
The thin target could be used for beam diagnostics by means the radiation that is induced by interaction of beam particles with target matter. The electron beams used in modern applications (as, for example, modern FELs) have very large brightness, small emittance as well as very short bunch length. For example, the bunch length of XFEL is about of 25 um at bunch charge order of 1 nC and with electrons energy of 17.5 GeV. The passage of this powerful short bunches could damage the target or even completely destroy it. In the presented work the train of such bunches passages through the target is investigated. It is shown the target works in extreme regime close to phase transition temperature.
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