Optimizing components and evaluating technical performance of IR thermographic NDT systems / A. O. Chulkov, V. P. Vavilov, S. S. Pawar
Уровень набора: (RuTPU)RU\TPU\network\14324, Proceedings of SPIEЯзык: английский.Серия: Nondestructive Testing and CompositesРезюме или реферат: A typical infrared (IR) thermographic system intended for active thermal/IR nondestructive testing includes a heat source, an IR imager and a computer. The software ensures acquisition and processing of IR image sequences to result in a binary map of defects or other image which is to be interpreted by a thermographer in order to meet inspection requirements. Typically, hardware developers supply a certain set of technical parameters of their units, such as heater power, imager temperature resolution, acquisition rate and a set of available data processing algorithms. The suggested approach allows optimization of inspection parameters if thermal and optical parameters of test materials are known. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only..Примечания о наличии в документе библиографии/указателя: [References: 11 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | инфракрасное излучение | неразрушающий контроль | обработка данных | алгоритмы Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
[References: 11 tit.]
A typical infrared (IR) thermographic system intended for active thermal/IR nondestructive testing includes a heat source, an IR imager and a computer. The software ensures acquisition and processing of IR image sequences to result in a binary map of defects or other image which is to be interpreted by a thermographer in order to meet inspection requirements. Typically, hardware developers supply a certain set of technical parameters of their units, such as heater power, imager temperature resolution, acquisition rate and a set of available data processing algorithms. The suggested approach allows optimization of inspection parameters if thermal and optical parameters of test materials are known. © (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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