Calculation of structural parameters and design of a protective shield for an X-ray system / I. V. Plotnikova, L. A. Redko, S. S. Baus [et al.]
Уровень набора: Eurasian Physical Technical JournalЯзык: английский.Страна: .Резюме или реферат: The need to calculate the radiation protection of the radiation system is the basis in which diagnostic, design or assembly activities are carried out as part of non-destructive testing. The paper provides an analysis of the design features of x-ray systems and their technical characteristics, operating conditions, diagnostic capabilities of modern tomographic systems. The dependences of the distribution of X-ray radiation and voltage on the thickness of the protective screen are given. The calculation of the thickness of the protective screen is presented, which will allow you to design the body of the protective screen of the x-ray system. The above studies will facilitate the work of specialists in the development of new modifications of x-ray systems..Примечания о наличии в документе библиографии/указателя: [References: 28 tit.].Тематика: электронный ресурс | труды учёных ТПУ | model | control | design | x-ray radiation | characteristic | модели | контроль | дизайн | рентгеновское излучение | характеристики Ресурсы он-лайн:Щелкните здесь для доступа в онлайн | Щелкните здесь для доступа в онлайнTitle screen
[References: 28 tit.]
The need to calculate the radiation protection of the radiation system is the basis in which diagnostic, design or assembly activities are carried out as part of non-destructive testing. The paper provides an analysis of the design features of x-ray systems and their technical characteristics, operating conditions, diagnostic capabilities of modern tomographic systems. The dependences of the distribution of X-ray radiation and voltage on the thickness of the protective screen are given. The calculation of the thickness of the protective screen is presented, which will allow you to design the body of the protective screen of the x-ray system. The above studies will facilitate the work of specialists in the development of new modifications of x-ray systems.
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