Simple and robust methodology of defect thermal characterization based on thermal quadrupoles and polynomial approximation / D. A. Nesteruk, V. P. Vavilov, A. O. Chulkov, D. Burleigh
Уровень набора: NDT & E InternationalЯзык: английский.Страна: .Резюме или реферат: An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters..Примечания о наличии в документе библиографии/указателя: [References: 25 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | thermal nondestructive testing | defect characterization | thermal quadrupoles | polynomial fitting | неразрушающий контроль | дефекты | полиномы Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
[References: 25 tit.]
An approach is proposed to evaluate the depth and thickness of planar defects detected by thermal nondestructive testing (TNDT) methods. A 1D 3-layer thermal problem is solved by using the technique of thermal quadrupoles, and the solution of the corresponding inverse problem is presented in the polynomial form. The inverse solution involves a number of TNDT experimental parameters, in particular, differential temperature signals, dimensionless contrasts and their observation times. The accuracy of defect characterization is in the range of 2–15% in defect depth and from 10 to 40% in defect thickness. It is believed that the proposed defect characterization approach can be easily implemented in existing TNDT systems to provide approximate values of defect parameters.
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