Thin Wires and Edge Imaging Using Hard Bremsstrahlung Generated by a Microfocal Target of a Betatron / M. M. Rychkov, V. V. Kaplin, V. A. Smolyanskiy
Уровень набора: Journal of Nondestructive EvaluationЯзык: английский.Страна: .Резюме или реферат: The magnified images of thin wires, plastic, steel and lead plates which were obtained using linear microfocus hard bremsstrahlung generated through interaction of an 18 MeV electron beam with a 13 [mu]m thick Ta foil oriented along the internal beam of a B-18 betatron are presented. The images indicate high absorption contrast of the objects due to a small horizontal size of the radiation source the width of which is 115-fold smaller than the diameter of the electron beam. Some results have shown a few peculiarities in the images which were not earlier observed. Several results were compared with the ones obtained earlier using the microfocus bremsstrahlung generated by the 18 MeV electron beam of B-18 in a narrow Si target..Примечания о наличии в документе библиографии/указателя: [References: 50 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | betatron | internal beam | narrow target | bremsstrahlung | angular distributions | microstructure images | бетатроны | балки | тормозные излучения | угловые распределения | изображения | микроструктуры Ресурсы он-лайн:Щелкните здесь для доступа в онлайнTitle screen
[References: 50 tit.]
The magnified images of thin wires, plastic, steel and lead plates which were obtained using linear microfocus hard bremsstrahlung generated through interaction of an 18 MeV electron beam with a 13 [mu]m thick Ta foil oriented along the internal beam of a B-18 betatron are presented. The images indicate high absorption contrast of the objects due to a small horizontal size of the radiation source the width of which is 115-fold smaller than the diameter of the electron beam. Some results have shown a few peculiarities in the images which were not earlier observed. Several results were compared with the ones obtained earlier using the microfocus bremsstrahlung generated by the 18 MeV electron beam of B-18 in a narrow Si target.
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