TY  - BOOK
AU  - Alford, T. L.
AU  - Feldman, L. C.
AU  - Mayer, J. W.
TI  - Fundamental of Nanoscale Film Analysis
SN  - 9780387292601
PY  - 2007///
CY  - New York
PB  - Springer
KW  - Ð¤Ð¸Ð·Ð¸ÐºÐ° ÑÐ²ÐµÑÐ´Ð¾Ð³Ð¾ ÑÐµÐ»Ð°
KW  - stltpush
KW  - (RuTPU)RU\TPU\subj\63727
KW  - ÑÐ¸Ð·Ð¸ÐºÐ°
KW  - ÑÐ²ÐµÑÐ´ÑÐµ ÑÐµÐ»Ð°
KW  - ÑÑÑÑÐºÑÑÑÐ½ÑÐ¹ Ð°Ð½Ð°Ð»Ð¸Ð·
KW  - Ð¼Ð¾Ð½Ð¾ÐºÑÐ¸ÑÑÐ°Ð»Ð»Ñ
KW  - Ð½Ð°Ð½Ð¾ÐºÑÐ¸ÑÑÐ°Ð»Ð»Ñ
KW  - Ð½Ð°Ð½Ð¾ÑÑÑÑÐºÑÑÑÑ
KW  - Ð¸Ð·Ð¼ÐµÑÐµÐ½Ð¸Ñ
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½Ð°Ñ Ð¼Ð¸ÐºÑÐ¾ÑÐºÐ¾Ð¿Ð¸Ñ
KW  - ÑÐ²Ð¾Ð¹ÑÑÐ²Ð°
KW  - Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ
KW  - Ð¾Ð±Ð¾ÑÑÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ
KW  - Ð°Ð½Ð³Ð»Ð¸Ð¹ÑÐºÐ¸Ð¹ ÑÐ·ÑÐº
KW  - 539.2
KW  - 3
KW  - 621.385.833
N2  - Index: p. 330-336; ÐÐ¸Ð±Ð»Ð¸Ð¾Ð³ÑÐ°ÑÐ¸Ñ Ð² ÐºÐ¾Ð½ÑÐµ Ð³Ð»Ð°Ð²
ER  -