TY  - BOOK
AU  - Feldman, L. C.
AU  - Mayer, J. W.
TI  - Fundamentals of Surface and Thin Film Analysis
PY  - 1986///
CY  - New York
PB  - North-Holland
KW  - ÐÐ»ÐµÐ½ÐºÐ¸ ÑÐ¾Ð½ÐºÐ¸Ðµ
KW  - ÐÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ðµ
KW  - (ÑÐ²ÐµÑÐ´ÑÐµ ÑÐµÐ»Ð°)
KW  - stltpush
KW  - (RuTPU)RU\TPU\subj\71990
KW  - ÑÐ¸Ð·Ð¸ÐºÐ°
KW  - ÑÐ¸Ð·Ð¸ÑÐµÑÐºÐ¸Ðµ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ
KW  - ÑÐ¾Ð½ÐºÐ¸Ðµ Ð¿Ð»ÐµÐ½ÐºÐ¸
KW  - Ð°Ð½Ð°Ð»Ð¸Ð·
KW  - Ð¿Ð¾Ð²ÐµÑÑÐ½Ð¾ÑÑÐ½ÑÐµ ÑÐ²Ð¾Ð¹ÑÑÐ²Ð°
KW  - Ð°Ð½Ð³Ð»Ð¸Ð¹ÑÐºÐ¸Ð¹ ÑÐ·ÑÐº
KW  - 539.216.2
KW  - 3
N2  - Index: p. 345-352
ER  -