TY  - BOOK
AU  - Schmahl, G.
AU  - Rudolph, D.
ED  - X-Ray Microscopy
TI  - X-Ray Microscopy
T2  - Springer Series in Optical Sciences
SN  - 0387132716
PY  - 1984///
CY  - Berlin
PB  - Springer-Verlag
KW  - Ð ÐµÐ½ÑÐ³ÐµÐ½Ð¾Ð²ÑÐºÐ°Ñ Ð¼Ð¸ÐºÑÐ¾ÑÐºÐ¾Ð¿Ð¸Ñ
KW  - stltpush
KW  - (RuTPU)RU\TPU\subj\25070
KW  - ÑÐ¸Ð·Ð¸ÑÐµÑÐºÐ°Ñ Ð¾Ð¿ÑÐ¸ÐºÐ°
KW  - Ð¾Ð¿ÑÐ¸ÑÐµÑÐºÐ¸Ðµ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°Ð½Ð¸Ñ
KW  - ÑÐµÐ½ÑÐ³ÐµÐ½Ð¾Ð²ÑÐºÐ°Ñ Ð¾Ð¿ÑÐ¸ÐºÐ°
KW  - ÐºÐ¾Ð½ÑÐµÑÐµÐ½ÑÐ¸Ð¸
KW  - ÐÐµÑÐ¼Ð°Ð½Ð¸Ñ
KW  - Ð°Ð½Ð³Ð»Ð¸Ð¹ÑÐºÐ¸Ð¹ ÑÐ·ÑÐº
KW  - 535.33-3
KW  - 3
N2  - Bibliography at the end of reports
ER  -