TY  - GEN
AU  - Purgin, A.
AU  - Yakimov, E. V.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ (Ð¢ÐÐ£)
TI  - High performance microprocessor system for eddy current defectoscope measurement signal processing
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - Ð¼Ð¸ÐºÑÐ¾Ð¿ÑÐ¾ÑÐµÑÑÐ¾ÑÐ½ÑÐµ ÑÐ¸ÑÑÐµÐ¼Ñ
KW  - Ð²Ð¸ÑÑÐµÐ²ÑÐµ ÑÐ¾ÐºÐ¸
KW  - Ð´ÐµÑÐµÐºÑÐ¾ÑÐºÐ¾Ð¿Ñ
KW  - ÑÐ¸Ð³Ð½Ð°Ð»Ñ
KW  - Ð´Ð°Ð½Ð½ÑÐµ
KW  - ÑÐ±Ð¾Ñ Ð´Ð°Ð½Ð½ÑÑ
KW  - Ð¾Ð±ÑÐ°Ð±Ð¾ÑÐºÐ°
N2  - [References: p. 223 (3 tit.)]
UR  - http://earchive.tpu.ru/handle/11683/23367
UR  - http://www.lib.tpu.ru/fulltext/c/2014/C18/038.pdf
ER  -