TY  - GEN
AU  - Babaev, A. A.
AU  - Gogolev, A. S.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ (Ð¢ÐÐ£)
TI  - The thermal stress at short electron bunches passage through a thin target
T2  - Poster Session
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - ÑÐµÐ¿Ð»Ð¾Ð²Ð¾Ðµ Ð½Ð°Ð¿ÑÑÐ¶ÐµÐ½Ð¸Ðµ
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐµ ÑÐ³ÑÑÑÐºÐ¸
KW  - Ð¼Ð¸ÑÐµÐ½Ð¸
N2  - [References: p. 62 (4 tit.)]
UR  - http://earchive.tpu.ru/handle/11683/22378
UR  - http://www.lib.tpu.ru/fulltext/c/2015/C64/041.pdf
ER  -