TY  - ELEC
AU  - Vavilov, V. P.
AU  - Pawar, S. S.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ (Ð¢ÐÐ£)
TI  - Determining the lateral size of subsurface defects during active thermal nondestructive testing
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - Ð´ÐµÑÐµÐºÑÑ
KW  - ÑÐµÐ¿Ð»Ð¾Ð²Ð°Ñ ÑÐ°ÑÐ°ÐºÑÐµÑÐ¸ÑÑÐ¸ÐºÐ°
KW  - ÑÐ¾Ð¼Ð¾Ð³ÑÐ°ÑÐ¸Ñ
N2  - [References: p. 531 (6 tit.)]
UR  - http://dx.doi.org/10.1134/S1061830916090084
ER  -