TY  - ELEC
AU  - Chulkov, A. O.
AU  - Vavilov, V. P.
AU  - Pawar, S. S.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ (Ð¢ÐÐ£)
TI  - Optimizing components and evaluating technical performance of IR thermographic NDT systems
T2  - Nondestructive Testing and Composites
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - Ð¸Ð½ÑÑÐ°ÐºÑÐ°ÑÐ½Ð¾Ðµ Ð¸Ð·Ð»ÑÑÐµÐ½Ð¸Ðµ
KW  - Ð½ÐµÑÐ°Ð·ÑÑÑÐ°ÑÑÐ¸Ð¹ ÐºÐ¾Ð½ÑÑÐ¾Ð»Ñ
KW  - Ð¾Ð±ÑÐ°Ð±Ð¾ÑÐºÐ° Ð´Ð°Ð½Ð½ÑÑ
KW  - Ð°Ð»Ð³Ð¾ÑÐ¸ÑÐ¼Ñ
N2  - [References: 11 tit.]
UR  - http://dx.doi.org/10.1117/12.2222981
ER  -