TY  - ELEC
AU  - Psakhie, S. G.
AU  - Lotkov, A. I.
AU  - Meisner, S. N.
AU  - Meisner, L. L.
AU  - Sergeev, V. P.
AU  - Sungatulin, A. R.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ (Ð¢ÐÐ£)
TI  - Effect of surface modification by silicon ion beam on microstructure and chemical composition of near-surface layers of titanium nickelide
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - ÑÐ¸ÑÐ°Ð½
KW  - Ð¿Ð¾Ð²ÐµÑÑÐ½Ð¾ÑÑÑ
KW  - ÐºÑÐµÐ¼Ð½Ð¸Ð¹
KW  - Ð¼Ð¾Ð´Ð¸ÑÐ¸ÐºÐ°ÑÐ¸Ð¸
KW  - Ð´Ð¸ÑÑÐ°ÐºÑÐ¸Ñ
KW  - ÑÑÐ°Ð³Ð¼ÐµÐ½ÑÐ°ÑÐ¸Ñ
N2  - [References: p. 462-463 (19 tit.)]
UR  - http://dx.doi.org/10.1134/S2075113313050134
ER  -