TY  - ELEC
AU  - Razzhuvalov, A. N.
AU  - Grinyaev, S. N.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ
TI  - Tunneling current in w-GaN/AlN(0001) structures with deep-level defects
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - Ð½Ð¸ÑÑÐ¸Ð´Ñ
KW  - ÑÑÐ½Ð½ÐµÐ»Ð¸ÑÐ¾Ð²Ð°Ð½Ð¸Ðµ
KW  - Ð´ÐµÑÐµÐºÑÑ
N2  - [References: p. 630 (24 tit.)]
UR  - https://doi.org/10.1016/j.spmi.2018.06.034
ER  -