TY  - ELEC
AU  - Filippov, A. V.
AU  - Tarasov, S. Yu.
ED  - ÐÐ°ÑÐ¸Ð¾Ð½Ð°Ð»ÑÐ½ÑÐ¹ Ð¸ÑÑÐ»ÐµÐ´Ð¾Ð²Ð°ÑÐµÐ»ÑÑÐºÐ¸Ð¹ Ð¢Ð¾Ð¼ÑÐºÐ¸Ð¹ Ð¿Ð¾Ð»Ð¸ÑÐµÑÐ½Ð¸ÑÐµÑÐºÐ¸Ð¹ ÑÐ½Ð¸Ð²ÐµÑÑÐ¸ÑÐµÑ
TI  - Nanoindentation on coarse-grained (CG) and ultrafine-grained (UFG) C11000 grade copper
KW  - ÑÐ»ÐµÐºÑÑÐ¾Ð½Ð½ÑÐ¹ ÑÐµÑÑÑÑ
KW  - ÑÑÑÐ´Ñ ÑÑÑÐ½ÑÑ Ð¢ÐÐ£
KW  - Ð½Ð°Ð½Ð¾Ð¸Ð½Ð´ÐµÐ½ÑÐ¸ÑÐ¾Ð²Ð°Ð½Ð¸Ðµ
KW  - Ð¼ÐµÐ´Ñ
KW  - Ð¼Ð¸ÐºÑÐ¾ÑÑÑÑÐºÑÑÑÑ
KW  - ÑÐ²ÐµÑÐ´Ð¾ÑÑÑ
KW  - ÑÐ¿ÑÑÐ³Ð¾ÑÑÑ
KW  - Ð¸Ð½Ð´ÐµÐ½ÑÐ¾ÑÑ
KW  - ÑÐºÐ¾Ð¿Ð»ÐµÐ½Ð¸Ñ
KW  - Ð¿Ð»Ð°ÑÑÐ¸ÑÐµÑÐºÐ¸Ðµ Ð´ÐµÑÐ¾ÑÐ¼Ð°ÑÐ¸Ð¸
N2  - [References: 11 tit.]
UR  - https://doi.org/10.1063/1.5131970
ER  -