Time-of-Flight Optical Diagnostics of High-Power Pulsed Ion Beams / V. A. Ryzhkov, B. A. Nechaev, V. N. Padalko
Уровень набора: Technical Physics LettersЯзык: английский.Резюме или реферат: An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference..Примечания о наличии в документе библиографии/указателя: [References: 4 tit.].Аудитория: .Тематика: электронный ресурс | труды учёных ТПУ | surface contamination | energy input | ablative plasma | hydrogen | carbon | поверхностное загрязнение | абляционная плазма | водород | углерод Ресурсы он-лайн:Щелкните здесь для доступа в онлайнНет реальных экземпляров для этой записи
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[References: 4 tit.]
An ablation of a thin layer of surface contamination of the target that self-recovers after each pulse of a powerful ion beam has been used to control ion fluences. Using a time-of-flight optical spectrometer, the average speeds of the lightest components of the ablative plasma, which are hydrogen and carbon, have been measured. and the ion fluence has been determined by their difference.
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