Title screen

The method of a self-testing (m, n)-code checker design based on the use of CLBs is considered. CLBs are supposed to be carried out in the framework of LUT-technology. To design the checker, a special expansion formula is used. The set V of checker faults includes all multiple stuck-at faults occurred at CLB inputs. The number l of code words appearing at the inputs of the checker can be less than the number of all possible code words. It implies that some faults of the self-testing checker connected to the outputs of the self-checking circuit can be undetectable. The paper establishes a property of a subset of code words, which allows us to check if a given subset provides the self-testing property of the checker. The property is used in the developed algorithm for analyzing a subset of code words.