000 | 01712nam0a2200265 4500 | ||
---|---|---|---|
001 | 595894 | ||
005 | 20231030033641.0 | ||
035 | _a(RuTPU)RU\TPU\tpu\17778 | ||
035 | _aRU\TPU\tpu\16893 | ||
090 | _a595894 | ||
100 | _a20100701d1999 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aCN | ||
105 | _ay z 100zy | ||
200 | 1 |
_aSmall-size betatrons for flaw detection _fV. L. Chakhlov, M. M. Shtein, V. A. Kas'yanov |
|
330 | _aThe Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV. | ||
333 | _aВ фонде НТБ ТПУ отсутствует | ||
463 |
_tProceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999 _vP. 791-793 _d1999 |
||
610 | 1 | _aтруды учёных ТПУ | |
700 | 1 |
_aChakhlov _bV. L. _cphysicist _cHonored worker of science and technology of the Russian Federation _cHonored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc) _f1934-2011 _gVladimir Lukianovich _xTPU _2stltpush _3(RuTPU)RU\TPU\pers\30042 |
|
701 | 1 |
_aShtein _bM. M. _cPhysicist _cHead of Laboratory at Tomsk Polytechnic University, Candidate of technical sciences _f1938- _gMikhail Mikhailovich _2stltpush _3(RuTPU)RU\TPU\pers\31482 _4070 |
|
701 | 1 |
_aKas'yanov _bV. A. |
|
801 | 1 |
_aRU _b63413507 _c20091207 |
|
801 | 2 |
_aRU _b63413507 _c20131119 _gRCR |
|
942 | _cBK |