000 01712nam0a2200265 4500
001 595894
005 20231030033641.0
035 _a(RuTPU)RU\TPU\tpu\17778
035 _aRU\TPU\tpu\16893
090 _a595894
100 _a20100701d1999 k y0engy50 ba
101 0 _aeng
102 _aCN
105 _ay z 100zy
200 1 _aSmall-size betatrons for flaw detection
_fV. L. Chakhlov, M. M. Shtein, V. A. Kas'yanov
330 _aThe Introscopy Institute of Tomsk Polytechnical University (SRII of TPU) is a large institution established with the goal of developing and designing nondestructive testing (NDT) systems for industrial application. The traditional direction in this field is related to the fabrication of mobile NDT systems using small-size betatrons. Up to the present, SRII continues to produce small-size betatrons with a maximum energy from 4 to 10 MeV.
333 _aВ фонде НТБ ТПУ отсутствует
463 _tProceedings of the 3rd International Symposium on Test and Measurement, ISTM-99, Xi'an, China, 2-4 June, 1999
_vP. 791-793
_d1999
610 1 _aтруды учёных ТПУ
700 1 _aChakhlov
_bV. L.
_cphysicist
_cHonored worker of science and technology of the Russian Federation
_cHonored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc)
_f1934-2011
_gVladimir Lukianovich
_xTPU
_2stltpush
_3(RuTPU)RU\TPU\pers\30042
701 1 _aShtein
_bM. M.
_cPhysicist
_cHead of Laboratory at Tomsk Polytechnic University, Candidate of technical sciences
_f1938-
_gMikhail Mikhailovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31482
_4070
701 1 _aKas'yanov
_bV. A.
801 1 _aRU
_b63413507
_c20091207
801 2 _aRU
_b63413507
_c20131119
_gRCR
942 _cBK