000 | 02227nam1a2200313 4500 | ||
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001 | 596980 | ||
005 | 20231030033716.0 | ||
035 | _a(RuTPU)RU\TPU\tpu\20068 | ||
035 | _aRU\TPU\tpu\20038 | ||
090 | _a596980 | ||
100 | _a20110926d1997 k y0engy50 ba | ||
101 | 1 | _aeng | |
200 | 1 |
_aModification of a disordered Ni3Fe alloy surface by 50 keV Zr ion implantation _fY. P. Sharkeev [et al.] |
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320 |
_9572 _aReferences: 18 tit. |
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330 | _aIt is well known that after ion implantation, microstructural changes are found at depths well beyond the range of the implanted ions. In the present work samples of a disordered Ni3Fe alloy, implanted with four doses of a multicomponent ion beam (where the principal component was zirconium) in the range 0.6-6.0 × 1017 ions cm-2, have been studied by transmission electron microscopy with subsidiary measurements being made of microhardness and residual stress in some of the samples. It is found that the implanted zone becomes increasingly amorphous and ZrO2 precipitates of increasing size appear as the implanted dose increases. These are accompanied by high internal stresses evidenced by electron micro-diffraction and confirmed by X-ray diffraction measurements. Immediately below the implanted zone, the dislocation density is increased by 2-3 times, depending on the implanted dose, and decreases monotonically down to a depth of about 10 μm. This is accompanied by corresponding increases in microhardness and residual stress which becomes increasingly tensile with the implanted dose. | ||
333 | _aВ фонде НТБ ТПУ отсутствует | ||
461 | _tThin Solid Films | ||
463 |
_tVol. 308-309, № 1-4 (31 October 1997) _vP. 393-398 _d1997 |
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610 | 1 | _aтруды учёных ТПУ | |
701 | 1 |
_aSharkeev _bY. P. |
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701 | 1 |
_aPerry _bA. J. |
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701 | 1 |
_aGeist _bD. E. |
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701 | 1 |
_aRyabchikov _bA. I. _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _cphysicist _f1950- _gAleksandr Ilyich _xTPU _2stltpush _3(RuTPU)RU\TPU\pers\30912 |
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701 | 1 |
_aTailashev _bA. S. |
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701 | 1 |
_aGirsova _bN. V. |
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701 | 1 |
_aKozlov _bE. V. |
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801 | 1 |
_aRU _b63413507 _c20100309 |
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801 | 2 |
_aRU _b63413507 _c20131016 _gRCR |
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942 | _cBK |