000 01151nam0a2200277 4500
001 599150
005 20231030033818.0
035 _a(RuTPU)RU\TPU\tpu\23011
035 _aRU\TPU\tpu\23009
090 _a599150
100 _a20130402d1997 k y0engy50 ba
101 0 _aeng
102 _aNL
105 _ay z 100zy
200 1 _aImproving transient thermal NDT performance by using image processing techniques
_fE. Grinzato [и др.]
333 _aВ фонде НТБ ТПУ отсутствует
461 _tProceedings of the 14th World Conference on NDT (14th WCNDT), December 8-13, 1996, New Delhi, India
_d1997
463 _tVol. 1
_vP. 131-134
_d1997
610 1 _aтруды учёных ТПУ
701 1 _aGrinzato
_bE.
701 1 _aBison
_bP.G.
701 1 _aMarinetti
_bS.
701 1 _aVavilov
_bV. P.
_cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT)
_cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU)
_f1949-
_gVladimir Platonovich
_xTPU
_2stltpush
_3(RuTPU)RU\TPU\pers\32161
801 1 _aRU
_b63413507
_c20130326
801 2 _aRU
_b63413507
_c20140419
_gRCR
942 _cBK