000 | 01151nam0a2200277 4500 | ||
---|---|---|---|
001 | 599150 | ||
005 | 20231030033818.0 | ||
035 | _a(RuTPU)RU\TPU\tpu\23011 | ||
035 | _aRU\TPU\tpu\23009 | ||
090 | _a599150 | ||
100 | _a20130402d1997 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aNL | ||
105 | _ay z 100zy | ||
200 | 1 |
_aImproving transient thermal NDT performance by using image processing techniques _fE. Grinzato [и др.] |
|
333 | _aВ фонде НТБ ТПУ отсутствует | ||
461 |
_tProceedings of the 14th World Conference on NDT (14th WCNDT), December 8-13, 1996, New Delhi, India _d1997 |
||
463 |
_tVol. 1 _vP. 131-134 _d1997 |
||
610 | 1 | _aтруды учёных ТПУ | |
701 | 1 |
_aGrinzato _bE. |
|
701 | 1 |
_aBison _bP.G. |
|
701 | 1 |
_aMarinetti _bS. |
|
701 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _xTPU _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
801 | 1 |
_aRU _b63413507 _c20130326 |
|
801 | 2 |
_aRU _b63413507 _c20140419 _gRCR |
|
942 | _cBK |