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001 599527
005 20231030033830.0
035 _a(RuTPU)RU\TPU\tpu\23612
035 _aRU\TPU\tpu\22821
090 _a599527
100 _a20130913a1982 k y0engy50 ba
101 1 _aeng
102 _aUS
200 1 _aAc dielectric losses and electrical conductivity of vanadium-borate glass
_fV. I. Kosintsev [et. al.]
320 _aReferences: p. 460 (15 tit.)
330 _aThe conductivity and capacitance of bulk and thin-film metal-glass-metal structures with the glass based on the composition: 32.56% V 2O 5, 46.18% B 2O 3, and 21.26% CaO (mole %) are measured in the frequency interval 2·10 2-2·10 4 Hz and the temperature interval 300-500°K. The frequency-temperature dependences of the real and imaginary parts of the complex dielectric constant calculated from the results of the measurements indicate the presence of the process of relaxation polarization in the glass under investigation. The parameters of the relaxation process are determined. It is proposed that the presence of the relaxation component of the conductivity and losses is due to localization of small-radius polarons (SRP) in the vicinity of positively charged defect centers
333 _aВ фонде НТБ ТПУ отсутствует
461 _tSoviet Physics Journal
_d1965-1992
463 _tVol. 25, № 5
_vP. 456-460
_d1982
610 1 _aтруды учёных ТПУ
701 1 _aKosintsev
_bV. I.
_cChemical Engineer
_cconsulting professor, Doctor of technical sciences
_f1939-
_gVictor Ivanovich
_xTPU
_2stltpush
_3(RuTPU)RU\TPU\pers\31066
701 1 _aKalygina
_bV. M.
701 1 _aGaman
_bV. I.
701 1 _aHodebadze
_bO. E.
801 1 _aRU
_b63413507
_c20110727
801 2 _aRU
_b63413507
_c20130913
_gRCR
942 _cBK