| 000 | 01864nam1a2200301 4500 | ||
|---|---|---|---|
| 001 | 599529 | ||
| 005 | 20231030033830.0 | ||
| 035 | _a(RuTPU)RU\TPU\tpu\23614 | ||
| 035 | _aRU\TPU\tpu\23612 | ||
| 090 | _a599529 | ||
| 100 | _a20130913a1981 k y0engy50 ba | ||
| 101 | 1 | _aeng | |
| 102 | _aUS | ||
| 200 | 1 |
_aElectrical properties of mim structures based on vanadium-borate glass _fV. M. Kalygina [et. el.] |
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| 320 | _aReferences: p. 265-266 (15 tit.) | ||
| 330 | _aThe results are given of investigation of the dc and ac electrical properties of thin-film metal-insulator-metal structures of capacitor type based on glass of the composition 35% B2O3-15% CaO-20% V2O4-30% V2O5 (wt.%). The glass films were deposited by an explosive method on a glassceramic substrate at t°=80°C. Upper and lower Nichrome electrodes were obtained by thermal evaporation. The influence of annealing on the conductivity and current-voltage characteristics of such structures was investigated. It was found that the current-voltage characteristics before and after annealing are determined in a wide range of temperatures and constant electric fields by contact barriers on the metal-glass-film interface. The ac behavior of the samples at f >102 Hz is due to the bulk properties of the glass film | ||
| 333 | _aВ фонде НТБ ТПУ отсутствует | ||
| 461 |
_tSoviet Physics Journal _d1965-1992 |
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| 463 |
_tVol. 24, № 3 _vP. 262-266 _d1981 |
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| 610 | 1 | _aтруды учёных ТПУ | |
| 701 | 1 |
_aKalygina _bV. M. |
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| 701 | 1 |
_aKosintsev _bV. I. _cChemical Engineer _cconsulting professor, Doctor of technical sciences _f1939- _gVictor Ivanovich _xTPU _2stltpush _3(RuTPU)RU\TPU\pers\31066 |
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| 701 | 1 |
_aGaman _bV. I. |
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| 701 | 1 |
_aModebadze _bO. E. |
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| 701 | 1 |
_aNikolaev _bA. I. |
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| 801 | 1 |
_aRU _b63413507 _c20110727 |
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| 801 | 2 |
_aRU _b63413507 _c20130926 _gRCR |
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| 942 | _cBK | ||