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001 599615
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035 _a(RuTPU)RU\TPU\tpu\23719
035 _aRU\TPU\tpu\23718
090 _a599615
100 _a20130926a1977 k y0engy50 ba
101 1 _aeng
102 _aUS
200 1 _aThermostimulated current of dielectric relaxation in metal-vanadium phosphate glass-metal systems
_fÉ. F. Ryannel', V. I. Gaman, V. I. Kosintsev
320 _aReferences: p. 219 (6 tit.)
330 _aThe nature of the maxima of the thermostimulated current of dielectric relaxation in the thinfilm system metal-vanadium phosphate glass-metal is discussed. The experimental data is analyzed, taking into account the presence of a blocking barrier layer at the metalglass interface and allowing for the fact that the charge carriers in the glass have an activated mobility. The mobility of the charge carriers and their activation energy as well as the energetic position of the impurity levels and their concentration are determined from the curves of the temperature dependence of relaxation current
333 _aВ фонде НТБ ТПУ отсутствует
461 _tSoviet Physics Journal
_d1965-1992
463 _tVol. 20, № 2
_vP. 213-219
_d1977
610 1 _aтруды учёных ТПУ
700 1 _aRyannel'
_bÉ. F.
701 1 _aGaman
_bV. I.
701 1 _aKosintsev
_bV. I.
_cChemical Engineer
_cconsulting professor, Doctor of technical sciences
_f1939-
_gVictor Ivanovich
_xTPU
_2stltpush
_3(RuTPU)RU\TPU\pers\31066
801 1 _aRU
_b63413507
_c20110727
801 2 _aRU
_b63413507
_c20130926
_gRCR
942 _cBK