| 000 | 01523nam1a2200277 4500 | ||
|---|---|---|---|
| 001 | 599789 | ||
| 005 | 20231030033838.0 | ||
| 035 | _a(RuTPU)RU\TPU\tpu\23925 | ||
| 035 | _aRU\TPU\tpu\23924 | ||
| 090 | _a599789 | ||
| 100 | _a20131110a1987 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 200 | 1 |
_aFlaw-detection characteristics of the compact MIB-4 betatron _fD. A. Boiko, A. A. Filimonov, V. L. Chakhlov |
|
| 300 | _aTranslated from Defektoskopiya; 23: No. 1, 27-31 (Jan 1986) | ||
| 330 | _aInformation which refines and complements the method of inspecting parts by means of the MIB-4 device is provided. The results obtained in testing this equipment abroad are given. | ||
| 333 | _aВ фонде НТБ ТПУ отсутствует | ||
| 461 |
_tSoviet Journal of Nondestructive Testing _d1965- |
||
| 463 |
_tVol. 23, iss. 1 _vP. 21-25 _d1987 |
||
| 610 | 1 | _aтруды учёных ТПУ | |
| 700 | 1 |
_aBoiko _bD. A. |
|
| 701 | 1 |
_aFilimonov _bA. A. _cspecialist in the field of non-destructive testing _cSenior researcher of Tomsk Polytechnic University, Candidate of technical sciences _f1938- _gAnatoly Alekseevich _2stltpush _3(RuTPU)RU\TPU\pers\32271 |
|
| 701 | 1 |
_aChakhlov _bV. L. _cphysicist _cHonored worker of science and technology of the Russian Federation _cHonored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc) _f1934-2011 _gVladimir Lukianovich _xTPU _2stltpush _3(RuTPU)RU\TPU\pers\30042 _4070 |
|
| 801 | 1 |
_aRU _b63413507 _c20131110 |
|
| 801 | 2 |
_aRU _b63413507 _c20200603 _gRCR |
|
| 942 | _cBK | ||