000 01330nam0a2200373 4500
001 600418
005 20231030033855.0
035 _a(RuTPU)RU\TPU\tpu\24846
035 _aRU\TPU\tpu\24845
090 _a600418
100 _a20140328d1993 m y0engy50 ba
101 0 _aeng
102 _aJP
105 _aa z 001zy
200 1 _aMeasurements of Thickness Dependence of Parametric X-Radiation from Si
_epreprint Hiroshima University HUPD-9319
_fI. Endo [et al.]
_gHiroshima University
210 _aHiroshima
_d1993
215 _a15 p.
333 _aВ фонде НТБ ТПУ отсутствует
610 1 _aтруды учёных ТПУ
610 1 _aпрепринты
701 1 _aEndo
_bI.
701 1 _aHarada
_bM.
701 1 _aKobayashi
_bT.
701 1 _aLee
_bY. S.
701 1 _aTakahashi
_bT.
701 1 _aMuto
_bM.
701 1 _aYoshida
_bK.
701 1 _aNitta
_bH.
701 1 _aPotylitsyn
_bA. P.
_cRussian physicist
_cProfessor of the TPU
_f1945-
_gAlexander Petrovich
_xTPU
_2stltpush
_3(RuTPU)RU\TPU\pers\26306
701 1 _aZabaev
_bV. N.
_cphysicist
_cassociate professor of Tomsk Polytechnic University
_f1946-
_gViktor Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31534
712 0 2 _aHiroshima University
_cJapan
801 1 _aRU
_b63413507
_c20140225
801 2 _aRU
_b63413507
_c20140328
_gRCR
942 _cBK