000 02408nlm1a2200373 4500
001 636313
005 20231030040131.0
035 _a(RuTPU)RU\TPU\network\245
090 _a636313
100 _a20131119a2013 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrnn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aDiffraction radiation interference pattern obtained upon electron beam propagation through a slit target
_fD. A. Shkitov [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[Referen.: p.787 (10 title)]
330 _aThe interference pattern of coherent diffraction radiation (CDR) from a silt target is measured using the extracted beam of the microtron at Tomsk Polytechnic University. A theoretical interference pattern is calculated based on a model developed earlier for calculating the CDR characteristics in the far and near zones with allowance for the detector-sensitivity function. Comparison of the theoretical and experimental interference patterns makes it possible to obtain information about the longitudinal size of the bunch. The results obtained by the proposed and earlier methods agree well with each other
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tJournal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
_oScientific Journal
_d2013
463 _tVol. 7, Iss. 4
_v[P. 784-787]
_d2013
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
701 1 _aShkitov
_bD. A.
_cexpert in the field of applied physics
_cdesign engineer at Tomsk Polytechnic University
_f1985-
_gDmitriy Andreevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31538
701 1 _aNaumenko
_bG. A.
_cphysicist
_csenior research fellow of Tomsk Polytechnic University
_f1947-
_gGennadiy Andreevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31524
701 1 _aShevelev
_bM. V.
_cexpert in the field of nuclear physics
_cengineer at Tomsk Polytechnic University
_f1985-
_gMihail Viktorovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31529
701 1 _aPotylitsyn
_bA. P.
_cRussian physicist
_cProfessor of the TPU
_f1945-
_gAlexander Petrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\26306
701 1 _aDeng
_bH.
701 1 _aWang
_bX.
801 2 _aRU
_b63413507
_c20160602
_gRCR
856 4 _uhttp://dx.doi.org/10.1134/S102745101304037X
942 _cCF