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035 _a(RuTPU)RU\TPU\network\1090
090 _a637022
100 _a20140425a1993 k y0engy50 ba
101 1 _aeng
102 _aRU
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aElectromagnetic-emission diagnostics of dielectric materials under ultrasonic loading
_fV. L. Chakhlov, V. I. Simanchuk, A. V. Kargapol'tsev
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: p. 763 (7 tit.)]
330 _aThe electromagnetic-emission diagnostic inspection of solid dielectrics subjected to ultrasonic loading created by a pulsed laser beam of nanosecond duration is investigated experimentally. The experimental apparatus and procedure are described. It is shown that the procedure is an effective diagnostic tool for monitoring the electrical state and structure of solid dielectric materials.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tRussian Physics Journal
463 _tVol. 36, iss. 8
_v[P. 758-763]
_d1993
610 1 _aтруды учёных ТПУ
610 1 _aэлектронный ресурс
610 1 _aдиэлектрические материалы
610 1 _aэлектромагнитная диагностика
700 1 _aChakhlov
_bV. L.
_cphysicist
_cHonored worker of science and technology of the Russian Federation
_cHonored Professor of Tomsk Polytechnic University, Doctor ofTechnical Sciences (DSc)
_f1934-2011
_gVladimir Lukianovich
_2stltpush
_3(RuTPU)RU\TPU\pers\30042
701 1 _aSimanchuk
_bV. I.
701 1 _aKargapol'tsev
_bA. V.
801 2 _aRU
_b63413507
_c20180316
_gRCR
856 4 _uhttp://link.springer.com/article/10.1007%2FBF00562029
942 _cCF