| 000 | 02894nlm1a2200553 4500 | ||
|---|---|---|---|
| 001 | 637143 | ||
| 005 | 20231030040200.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\1240 | ||
| 035 | _aRU\TPU\network\1233 | ||
| 090 | _a637143 | ||
| 100 | _a20140520a2010 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aExperimental demonstration of a robust and scalable flux qubit _fR. Harris [et al.] |
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| 203 |
_aText _celectronic |
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| 300 | _aTitle screen | ||
| 320 | _a[References: 61 tit.] | ||
| 330 | _aA rf–superconducting quantum interference device (SQUID) flux qubit that is robust against fabrication variations in Josephson-junction critical currents and device inductance has been implemented. Measurements of the persistent current and of the tunneling energy between the two lowest-lying states, both in the coherent and incoherent regimes, are presented. These experimental results are shown to be in agreement with predictions of a quantum-mechanical Hamiltonian whose parameters were independently calibrated, thus justifying the identification of this device as a flux qubit. In addition, measurements of the flux and critical current noise spectral densities are presented that indicate that these devices with Nb wiring are comparable to the best Al wiring rf SQUIDs reported in the literature thus far, with a 1/f flux noise spectral density at 1 Hz of 1.3−0.5+0.7 μΦ0/Hz. An explicit formula for converting the observed flux noise spectral density into a free-induction-decay time for a flux qubit biased to its optimal point and operated in the energy eigenbasis is presented | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 |
_tPhysical Review B _oScientific Journal _d1970- |
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| 463 |
_tVol. 81, iss. 13 _v[134510] _d2010 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 701 | 1 |
_aHarris _bR. |
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| 701 | 1 |
_aJohnson _bM. W. |
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| 701 | 1 |
_aBerkley _bA. J. |
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| 701 | 1 |
_aJohnson _bM. W. |
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| 701 | 1 |
_aLanting _bT. |
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| 701 | 0 | _aSiyuan Han | |
| 701 | 1 |
_aBunyk _bP. |
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| 701 | 1 |
_aLadizinsky _bN. |
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| 701 | 1 |
_aOh _bT. |
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| 701 | 1 |
_aPerminov _bI. |
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| 701 | 1 |
_aTolkacheva _bE. |
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| 701 | 1 |
_aUchaykin _bS. V. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University, Doctor of physical and mathematical sciences _f1963- _gSergey Victorovich _2stltpush _3(RuTPU)RU\TPU\pers\32279 |
|
| 701 | 1 |
_aChapple _bE. M. |
|
| 701 | 1 |
_aEnderud _bC. |
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| 701 | 1 |
_aRich _bC. |
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| 701 | 1 |
_aThom _bM. |
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| 701 | 1 |
_aWang _bJ. |
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| 701 | 1 |
_aWilson _bB. |
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| 701 | 1 |
_aRose _bG. |
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| 801 | 2 |
_aRU _b63413507 _c20150416 _gRCR |
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| 856 | 4 | _uhttp://dx.doi.org/10.1103/PhysRevB.81.134510 | |
| 856 | 4 | _uhttp://arxiv.org/abs/0909.4321 | |
| 942 | _cCF | ||