| 000 | 01989nlm0a2200373 4500 | ||
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| 001 | 637190 | ||
| 005 | 20231030040201.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\1287 | ||
| 090 | _a637190 | ||
| 100 | _a20140603a1990 k y0rusy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 105 | _aa z 101zy | ||
| 135 | _adrnn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aAdvanced IR sensing technology researchings in the city of Tomsk, USSR _fV. P. Vavilov [et al.] |
|
| 203 |
_aText _celectronic |
||
| 300 | _aTitle screen | ||
| 320 | _a[Ref.: p. 308 (2 tit.)] | ||
| 330 | _aDevelopment of thermophysical approach to the solution of thermal nondestructive testing has led to the so called 'dynamic thermal tomography" which allows to picturize the in-deep distribution of thermophysical properties including defects' description. Some aspects of the thermal tomography are discussed | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 463 |
_tThermosense XII, Orlando, FL, United States, April 20, 1990 _oProc. SPIE 1313 _v[P. 307-308] _d1990 |
||
| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 701 | 1 |
_aVavilov _bV. P. _cSpecialist in the field of dosimetry and methodology of nondestructive testing (NDT) _cDoctor of technical sciences (DSc), Professor of Tomsk Polytechnic University (TPU) _f1949- _gVladimir Platonovich _2stltpush _3(RuTPU)RU\TPU\pers\32161 |
|
| 701 | 1 |
_aIvanov _bA. I. |
|
| 701 | 1 |
_aIsakov _bA. V. |
|
| 701 | 1 |
_aReino _bV. V. |
|
| 701 | 1 |
_aShiryaev _bV. V. _cspecialist in the field of non-destructive testing _cSenior researcher of Tomsk Polytechnic University, Candidate of technical sciences _f1948- _gVladimir Vasilyevich _2stltpush _3(RuTPU)RU\TPU\pers\32219 |
|
| 701 | 1 |
_aTsvyk _bV. V. _gRuvim S. |
|
| 801 | 2 |
_aRU _b63413507 _c20140603 _gRCR |
|
| 856 | 4 | _uhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=945256 | |
| 942 | _cCF | ||