| 000 | 03552nla2a2200421 4500 | ||
|---|---|---|---|
| 001 | 641232 | ||
| 005 | 20231030040421.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\6131 | ||
| 035 | _aRU\TPU\network\6106 | ||
| 090 | _a641232 | ||
| 100 | _a20150514a2015 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 102 | _aUS | ||
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aControl of Defects on the Parameters of the Electromagnetic Response under Pulsed Mechanical Excitation of the Sample _fP. N. Khorsov, N. N. Khorsov, V. P. Surzhikov |
|
| 203 |
_aText _celectronic |
||
| 225 | 1 | _aStructure Materials, Mechanics and Dynamics of Materials | |
| 300 | _aTitle screen | ||
| 330 | _aThe paper assessed the possibility of using acoustic emission from the dielectric sample during stepwise loading. The electromagnetic signal from the sample was detected by using an apparatus of mechanical repeatedly pulsed excitation of the sample at each stage of loading. It was found that the response consists of a deterministic component (due to the excitation pulse) and random components noise and acoustic emission. It were allocated random components, calculated their standard deviations. The influence of the electromagnetic emission on standard deviation of the random component of response under step load on the specimen was evaluated. It has been shown that the component of the electromagnetic emission can be an informative parameter to evaluate defectiveness of the object of a dielectric material under load. | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\4598 _tAdvanced Materials Research _oScientific Journal |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\4656 _tVol. 1085 : Prospects of Fundamental Sciences Development (PFSD-2014) _oThe XIth International Conference, April 22-25, 2014, Tomsk, Russia _o[proceedings] _v[P. 316-318] _d2015 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aнапряженно-деформированные состояния | |
| 610 | 1 | _aэлектромагнитные излучения | |
| 610 | 1 | _aдефекты | |
| 610 | 1 | _aимпульсное возбуждение | |
| 700 | 1 |
_aKhorsov _bP. N. _cspecialist in the field of non-destructive testing _csenior researcher of Tomsk Polytechnic University _f1986- _gPetr Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\34578 |
|
| 701 | 1 |
_aKhorsov _bN. N. _cspecialist in the field of non-destructive testing _cSenior researcher of Tomsk Polytechnic University _f1943- _gNikolay Nikolaevich _2stltpush _3(RuTPU)RU\TPU\pers\32242 |
|
| 701 | 1 |
_aSurzhikov _bV. P. _cspecialist in the field of non-destructive testing _csenior researcher of Tomsk Polytechnic University, candidate of physical and mathematical sciences _f1954- _gVladimir Petrovich _2stltpush _3(RuTPU)RU\TPU\pers\34577 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
| 801 | 2 |
_aRU _b63413507 _c20161229 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.4028/www.scientific.net/AMR.1085.316 | |
| 942 | _cCF | ||