| 000 | 03505nla2a2200397 4500 | ||
|---|---|---|---|
| 001 | 641391 | ||
| 005 | 20231030040426.0 | ||
| 035 | _a(RuTPU)RU\TPU\network\6308 | ||
| 035 | _aRU\TPU\network\6306 | ||
| 090 | _a641391 | ||
| 100 | _a20150518a2015 k y0engy50 ba | ||
| 101 | 0 | _aeng | |
| 105 | _ay z 100zy | ||
| 135 | _adrcn ---uucaa | ||
| 181 | 0 | _ai | |
| 182 | 0 | _ab | |
| 200 | 1 |
_aComparison of Cable Insulation Control in Weak and Strong Electric Fields _fN. S. Starikova, V. V. Redko, G. V. Vavilova |
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| 203 |
_aText _celectronic |
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| 225 | 1 | _aModelling and Numerical Simulation, Algorithms and Mathematical Methods for Applied Problems | |
| 300 | _aTitle screen | ||
| 330 | _aIn this paper the modern methods of cable products insulation control are referred. A comparison of efficiency of the cable insulation defects control by changing in cable area capacitance is carried out in the strong and weak electric fields. The electric cable can be represented as a cylindrical capacitor, but to simplify the issue the insulation area is represented as a plate capacitor with anisotropic dielectric. The cable insulation model is created in the software Comsol Multyphysic. The effect of the defect dimension on the cable area electric capacitance in a strong and weak electric field is described. Also, the control sensitivity of both methods was assessed and compared with each other. The control sensitivity in a weak electric field is slightly higher for the defects with small size (less than 70% from insulation thickness). The control sensitivity in a strong electric field is considerably higher for the defects with big size (more than 70% from insulation thickness). | ||
| 333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
| 461 | 0 |
_0(RuTPU)RU\TPU\network\5920 _tApplied Mechanics and Materials _oScientific Journal |
|
| 463 | 0 |
_0(RuTPU)RU\TPU\network\6028 _tVol. 756 : Mechanical Engineering, Automation and Control Systems (MEACS2014) _oInternational Conference, 16‐18 October, 2014, Tomsk, Russia _o[proceedings] _fNational Research Tomsk Polytechnic University (TPU) _v[P. 486-490] _d2015 |
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| 610 | 1 | _aэлектронный ресурс | |
| 610 | 1 | _aтруды учёных ТПУ | |
| 610 | 1 | _aкабельное производство | |
| 610 | 1 | _aдефекты | |
| 610 | 1 | _aизоляция | |
| 700 | 1 |
_aStarikova _bN. S. _cspecialist in the field of non-destructive testing _cEngineer of Tomsk Polytechnic University _f1990- _gNadezhda Sergeevna _2stltpush _3(RuTPU)RU\TPU\pers\32605 |
|
| 701 | 1 |
_aRedko _bV. V. _cspecialist in the field of non-destructive testing _cAssociate Professor of Tomsk Polytechnic University, Candidate of technical sciences _f1974- _gVitaliy Vladimirovich _2stltpush _3(RuTPU)RU\TPU\pers\32887 |
|
| 701 | 1 |
_aVavilova _bG. V. _cspecialist in the field of non-destructive testing _cSenior lecturer of Tomsk Polytechnic University _f1981- _gGalina Vasilievna _2stltpush _3(RuTPU)RU\TPU\pers\32607 |
|
| 712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра информационно-измерительной техники (ИИТ) _h67 _2stltpush _3(RuTPU)RU\TPU\col\18718 |
| 801 | 2 |
_aRU _b63413507 _c20161229 _gRCR |
|
| 856 | 4 | _uhttp://dx.doi.org/10.4028/www.scientific.net/AMM.756.486 | |
| 942 | _cCF | ||