000 | 03405nla2a2200433 4500 | ||
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001 | 642247 | ||
005 | 20231030040455.0 | ||
035 | _a(RuTPU)RU\TPU\network\7186 | ||
035 | _aRU\TPU\network\6892 | ||
090 | _a642247 | ||
100 | _a20150617a2015 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aGB | ||
105 | _ay z 100zy | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aFeatures of radiation damage of Ni-Ti alloy under exposure to heavy ions of gaseous elements _fV. P. Poltavtseva [et al.] |
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203 |
_aText _celectronic |
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300 | _aTitle screen | ||
320 | _a[References: 12 tit.] | ||
330 | _aThe consistent patterns of changes in structural and phase state, hardening and temperature ranges of martensitic transformations in Ni-Ti alloy with the shape memory effect after implantation of heavy ions 16O3+, 40Ar8+ and 84Kr15+ under comparable parameters have been experimentally studied. It is found that under the impact of 84Kr15+ ions, a two-layer surface structure with radiation-hardened second layer is formed, radiation-stimulated phase transformation B19'→B2 occurs in the near-surface layer and out-range area, and the martensitic transformation temperature increases toward higher values after implantation of 40Ar8+ and 84Kr15+ ions. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
337 | _aAdobe Reader | ||
461 | 1 |
_0(RuTPU)RU\TPU\network\2008 _tIOP Conference Series: Materials Science and Engineering |
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463 | 1 |
_0(RuTPU)RU\TPU\network\7891 _tVol. 81 : Radiation-Thermal Effects and Processes in Inorganic Materials _oInternational Scientific Conference, 3-8 November 2014, Tomsk, Russia _o[proceedings] _v[012034, 6 p.] _d2015 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
701 | 1 |
_aPoltavtseva _bV. P. |
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701 | 1 |
_aKislitsin _bS. B. |
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701 | 1 |
_aSatpayev _bD. A. |
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701 | 1 |
_aMylnikova _bT. S. _clinguist _cSenior Lecturer of Tomsk Polytechnic University _f1959- _gTatyana Stepanovna _2stltpush _3(RuTPU)RU\TPU\pers\31241 |
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701 | 1 |
_aChernyavski (Chernyavskiy) _bA. V. _cspecialist in the field of electronics _csenior researcher of Tomsk Polytechnic University, candidate of physico-mathematical sciences _f1966- _gAleksandr Viktorovich _2stltpush _3(RuTPU)RU\TPU\pers\34159 |
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712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bКафедра иностранных языков Института неразрушающего контроля (ИЯНК) _h7143 _2stltpush _3(RuTPU)RU\TPU\col\18721 |
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут неразрушающего контроля (ИНК) _bПроблемная научно-исследовательская лаборатория электроники, диэлектриков и полупроводников (ПНИЛ ЭДиП) _h194 _2stltpush _3(RuTPU)RU\TPU\col\19033 |
801 | 2 |
_aRU _b63413507 _c20161212 _gRCR |
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856 | 4 | _uhttp://dx.doi.org/10.1088/1757-899X/81/1/012034 | |
856 | 4 | _uhttp://earchive.tpu.ru/handle/11683/14705 | |
942 | _cCF |