000 | 03053nlm1a2200361 4500 | ||
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001 | 644713 | ||
005 | 20231030040628.0 | ||
035 | _a(RuTPU)RU\TPU\network\9797 | ||
090 | _a644713 | ||
100 | _a20151127a2015 k y0engy50 ba | ||
101 | 0 | _aeng | |
102 | _aUS | ||
135 | _adrcn ---uucaa | ||
181 | 0 | _ai | |
182 | 0 | _ab | |
200 | 1 |
_aShot-to-shot stability of intense ion beam generation in a spiral diode with self-magnetic insulation _fA. I. Pushkarev, Yu. I. Isakova, I. P. Khailov |
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203 |
_aText _celectronic |
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225 | 1 | _aGeneral Experimental Techniques | |
300 | _aTitle screen | ||
320 | _a[References: p. 673-674 (20 tit.)] | ||
330 | _aThe results of a comparative analysis of the correctness of intense-ion-beam diagnostics, which is based on measurements of the ion-current-density and energy-density amplitudes, are presented. It is shown that when a nanosecond-duration pulsed ion beam is used to modify a surface, the main factor that determines changes in the properties of a treated item is a thermal effect rather than the ion implantation. The analysis of the influence of such factors as the ion-energy variation, the ion-beam composition, accelerated neutrals, the variation in the accelerating voltage, the diagnostics locality, and other factors on the accuracy of controlling the ion-beam impact on a target was performed. It was found that analyzing the stability of the thermal effect of an ion beam on the target on the basis of the amplitude of an ion-current density pulse yields an overestimated standard-deviation value. It was shown that measurements of the energy density provide more accurate and complete information that does not contain systematic errors. | ||
333 | _aРежим доступа: по договору с организацией-держателем ресурса | ||
461 | _tInstruments and Experimental Techniques | ||
463 |
_tVol. 58, iss. 5 _v[P. 675-682] _d2015 |
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610 | 1 | _aэлектронный ресурс | |
610 | 1 | _aтруды учёных ТПУ | |
700 | 1 |
_aPushkarev _bA. I. _cphysicist _cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences, Senior researcher _f1954- _gAleksandr Ivanovich _2stltpush _3(RuTPU)RU\TPU\pers\32701 |
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701 | 1 |
_aIsakova _bYu. I. _cphysicist _cJunior researcher of Tomsk Polytechnic University _f1988- _gYulia Ivanovna _2stltpush _3(RuTPU)RU\TPU\pers\32700 |
|
701 | 1 |
_aKhailov _bI. P. _cphysicist _cEngineer-Researcher of Tomsk Polytechnic University _f1990- _gIliya Pavlovich _2stltpush _3(RuTPU)RU\TPU\pers\32882 |
|
712 | 0 | 2 |
_aНациональный исследовательский Томский политехнический университет (ТПУ) _bИнститут физики высоких технологий (ИФВТ) _bКафедра техники и электрофизики высоких напряжений (ТЭВН) _h4779 _2stltpush _3(RuTPU)RU\TPU\col\18692 |
801 | 2 |
_aRU _b63413507 _c20170210 _gRCR |
|
856 | 4 | _uhttp://dx.doi.org/10.1134/S0020441215050127 | |
942 | _cCF |