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035 _a(RuTPU)RU\TPU\network\9797
090 _a644713
100 _a20151127a2015 k y0engy50 ba
101 0 _aeng
102 _aUS
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aShot-to-shot stability of intense ion beam generation in a spiral diode with self-magnetic insulation
_fA. I. Pushkarev, Yu. I. Isakova, I. P. Khailov
203 _aText
_celectronic
225 1 _aGeneral Experimental Techniques
300 _aTitle screen
320 _a[References: p. 673-674 (20 tit.)]
330 _aThe results of a comparative analysis of the correctness of intense-ion-beam diagnostics, which is based on measurements of the ion-current-density and energy-density amplitudes, are presented. It is shown that when a nanosecond-duration pulsed ion beam is used to modify a surface, the main factor that determines changes in the properties of a treated item is a thermal effect rather than the ion implantation. The analysis of the influence of such factors as the ion-energy variation, the ion-beam composition, accelerated neutrals, the variation in the accelerating voltage, the diagnostics locality, and other factors on the accuracy of controlling the ion-beam impact on a target was performed. It was found that analyzing the stability of the thermal effect of an ion beam on the target on the basis of the amplitude of an ion-current density pulse yields an overestimated standard-deviation value. It was shown that measurements of the energy density provide more accurate and complete information that does not contain systematic errors.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tInstruments and Experimental Techniques
463 _tVol. 58, iss. 5
_v[P. 675-682]
_d2015
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
700 1 _aPushkarev
_bA. I.
_cphysicist
_cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences, Senior researcher
_f1954-
_gAleksandr Ivanovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32701
701 1 _aIsakova
_bYu. I.
_cphysicist
_cJunior researcher of Tomsk Polytechnic University
_f1988-
_gYulia Ivanovna
_2stltpush
_3(RuTPU)RU\TPU\pers\32700
701 1 _aKhailov
_bI. P.
_cphysicist
_cEngineer-Researcher of Tomsk Polytechnic University
_f1990-
_gIliya Pavlovich
_2stltpush
_3(RuTPU)RU\TPU\pers\32882
712 0 2 _aНациональный исследовательский Томский политехнический университет (ТПУ)
_bИнститут физики высоких технологий (ИФВТ)
_bКафедра техники и электрофизики высоких напряжений (ТЭВН)
_h4779
_2stltpush
_3(RuTPU)RU\TPU\col\18692
801 2 _aRU
_b63413507
_c20170210
_gRCR
856 4 _uhttp://dx.doi.org/10.1134/S0020441215050127
942 _cCF