000 02160nlm1a2200361 4500
001 644847
005 20231030040632.0
035 _a(RuTPU)RU\TPU\network\9931
035 _aRU\TPU\network\4739
090 _a644847
100 _a20151202a1989 k y0engy50 ba
101 0 _aeng
135 _adrcn ---uucaa
181 0 _ai
182 0 _ab
200 1 _aMeasurement of spectral and polarization characteristics of parametric X-rays in a Si crystal
_fYu. N. Adishchev [et al.]
203 _aText
_celectronic
300 _aTitle screen
320 _a[References: p. 136 (15 tit.)]
330 _aSpectral distributions of parametric X-rays (PX) have been measured for 900 MeV electrons transmitted through a Si crystal. A displacement of the PX spectral line was observed with the crystal rotation and in scanning PX radiation reflection by a detector. A high degree of linear polarization (P = 0.8) of parametric X-rays was obtained.
333 _aРежим доступа: по договору с организацией-держателем ресурса
461 _tNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
_oScientific Journal
_d1984-
463 _tVol. 44, iss. 2
_v[P. 130-136]
_d1989
610 1 _aэлектронный ресурс
610 1 _aтруды учёных ТПУ
701 1 _aAdishchev
_bYu. N.
_cphysicist
_cProfessor of Tomsk Polytechnic University, Doctor of physical and mathematical sciences
_f1946-
_gYuri Nikolaevich
_2stltpush
_3(RuTPU)RU\TPU\pers\31869
701 1 _aVerzilov
_bV. A.
701 1 _aPotylitsyn
_bA. P.
_cRussian physicist
_cProfessor of the TPU
_f1945-
_gAlexander Petrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\26306
701 1 _aUglov
_bS. R.
_cphysicist
_csenior research fellow at Tomsk Polytechnic University
_f1958-
_gSergey Romanovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31533
701 1 _aVorobiev
_bS. A.
_cphysicist
_cSenior researcher of Tomsk Polytechnic University
_f1944-1992
_gSergey Aleksandrovich
_2stltpush
_3(RuTPU)RU\TPU\pers\31867
801 2 _aRU
_b63413507
_c20151203
_gRCR
856 4 _uhttp://dx.doi.org/10.1016/0168-583X(89)90417-5
942 _cCF